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荧光寿命成像显微系统

询价
 LaVision Biotech
 德国
2021-08-17 01:15
我要询单

北京欧兰科技发展有限公司

我要认领
北京欧兰科技发展有限公司
刘学龙
010-62623871
oplan@263.net
产品属性
供应商
规格MadPLL
产品说明

Instant AFM and nanoprobe instrumentation - just add science! View our AFM Video Tutorial.




Introduction

MadPLL® is a powerful instrument package that allows the user to create an inexpensive, high resolution resonant scanning probe microscope using Mad City Labs nanopositioning systems. In short, MadPLL® can be used to create an “instant” closed loop AFM or NSOM at a fraction of the cost of commercial systems.

MadPLL® has been specifically designed for resonant probes such as tuning forks and Akiyama probes. In addition MadPLL® is fully compatible with Mad City Labs’ high resolution nanopositioning systems which makes it easy for users to build a scanning probe microscope with a flexibility that cannot be achieved with other commercial systems. The seamless integration of hardware combined with the built-in automated control of MadPLL® means that you can concentrate on getting results.

MadPLL® is ideal for research and teaching laboratories offering high performance, versatility, simplicity and excellent value.
Features
  • Low cost
  • Software, PLL controller, sensor amplifier, and probe boards included
  • Easy and flexible configuration
  • Fully self contained - no external signals required
  • Automated software control
  • Auto PCC control
  • Auto Q Calculation, auto resonant frequency detection
  • Integrated Z axis PI control loop
  • Fully compatible with Mad City Labs positioning products

What is MadPLL®?

MadPLL® is an integrated solution that includes the digital phase lock loop (PLL) controller, software, sensor amplifier, probe board mount, and resonant probe mounting board. Simply add your Akiyama probe or tuning fork to the probe board to create a powerful force sensor for scanning probe measurements.
The MadPLL® package includes the MadPLL® digital PLL controller, sensor board, probe board, and MadPLL® software. Ease of integration with resonant probes and Mad City Labs' low noise nanopositioning systems give users the ability to create high performance, low cost NSOM and AFM instruments.


The PLL controller contains a digitally controlled proportional integral (PI) loop designed to work seamlessly with Mad City Labs’ nanopositioning systems. The addition of closed loop nanopositioners adds to the high performance of MadPLL®. Additional options are available for multi-axis closed loop nanopositioning control.

The PLL controller has three operational modes: self oscillation, PLL driven, and (lock-in) DDS driven. The probe can be controlled in constant excitation or constant signal mode. Measured outputs from the controller include changes in frequency, amplitude or phase shift.
The digital MadPLL® controller has three operational modes: self oscillation, PLL driven, and DDS driven. The probe can be controlled in constant excitation amplitude or constant signal amplitude. Changes in frequency, amplitude, or phase are measured for Z control.


The sensor amplifier is the interface between the MadPLL® controller and the probe. The sensor amplifier contains a preamplifier, an excitation signal attenuator, and a parasistic capacitance compensation (PCC) circuit. The probe board mount and probe board assemblies are compact and can be fitted to existing instrumentation. The probe board simply plugs into the probe board mount. The mount can be fixed to a precision positioner such as a closed loop nanopositioning system. The probe board has been designed for use with tuning forks and Akiyama probes. These probes are easy to mount and alignment free.
MadPLL® includes a sensor amplifier, probe boards, and intermediate probe mount. The probe boards are designed for use with tuning forks, Akiyama probes and Accutune probes.

MadPLL® Software

MadPLL® software simplifies the control of your scanning probe microscope. All of the functions of MadPLL® are fully automated but accessible via individual software control. Among the software features are automated setup, configuration control, auto-Q calculation and automatic parasitic capacitance compensation (PCC) control. These included features are designed to simplify setup and accelerate the data acquisition process. MadPLL® software integrates seamlessly with Mad City Labs' AFMView™ software. AFMView™ software is part of our complete SPM development system.

Application - AFM Video Tutorial

Instant AFM - just add science!


MadPLL® can be used to create a customized, high resolution Akiyama probe or tuning fork atomic force microscope (AFM) at a fraction of the cost of commercial systems. MadPLL® has been designed to directly interface with Mad City Labs’ low noise single and multi-axis nanopositioning systems, making it possible to create a fully closed loop AFM. The AFM described is suitable for both research and teaching environments and can be further customized for vacuum operation. MadPLL® is suitable for nanoscale characterization and nanoscale fabrication applications such as optical antennas, nano-optics, semiconductors, data storage, and more.
Mad City Labs AFM Assembly Tutorial - How to Build an "Instant" Atomic Force Microscope
Video Bill of Materials
  • SPM-M Kit
    • MadPLL® Instrument Package
      • digital phase lock loop (PLL) controller
      • Akiyama probe mounting board
      • sensor amplifier board
    • Nano-SPM200 nanopositioning stage (XY)
    • Nano-OP30 nanopositioning stage (Z)
    • 3 axis closed loop Nano-Drive® controller
    • Z axis open loop/close loop switch (OCL option)
    • Adapter plate between preamplifier and Nano-OP30
    • Adapter plate to Thorlabs MT1 micropositioner
  • XY and Z coarse motion: standard stages available from optical component suppliers
  • Probe:Akiyama probe
  • Hardware: standard optical mounting fixtures
  • PC: Windows XP/Vista/7 (32 bit or 64 bit compatible)

This configuration is a highly flexible, low cost, multi-axis, closed loop Akiyama or tuning fork AFM called the SPM-M Kit. All Mad City Labs nanopositioning systems have low noise PicoQ® sensor technology and closed loop feedback control. Using MadPLL® the user can create a high performance scanning probe instrument at low cost.

Additional options available from Mad City Labs
* All Mad City Labs nanopositioning systems include the Nano-Drive® controller which is fully LabVIEW/C++/MATLAB compatible.

AFM configurations typically achieve Z resolutions of 0.5nm (rms) and a scanning frequency of 1Hz. Higher resolutions and scan speeds can be achieved using different nanopositioner combinations. All Mad City Labs nanopositioning systems have low noise PicoQ® sensor technology and closed loop feedback control.

Recommended additional items
  • Vibration isolation table
  • Coarse Z-axis approach (manual or automated)

Image Gallery

Seeing is Believing!


The images below were acquired using MadPLL® with Mad City Labs closed loop nanopositioning systems.
Si (111) Atomic Steps
(312pm monatomic layer thickness)
2µm x 2µm
Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system and etched tungsten tip on a quartz tuning fork.
Si (111) Atomic Steps
(312pm monatomic layer thickness)
1.76µm x 2.02µm
Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system and Akiyama probe.
Calibration grid
(100nm tall lines, 2µm apart)
10µm x 10µm
Unidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system and Akiyama probe.

Calibration grid
(100nm tall pegs, spaced 2µm apart)
10µm x 10µm
Unidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system and Akiyama probe.

Fly eye
100µm x 100µm
Bidirectional scan
PLL mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.
Human hair
100µm x 100µm
Bidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.

PMMA pattern, uncured
10 µm x 10 µm
Bidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.

Integrated circuit
100 µm x 100 µm
Bidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.
Calibration grid
40 µm x 40 µm
Unidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.

Calibration grid
(100nm tall, 10µm pitch)
70 µm x 70 µm
Unidirectional scan
PLL mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.

Etched structures
80 µm x 80 µm
Bidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes) and Akiyama probe.

Technical Specifications

Lock-In Amplifier

Phase Shifter0° to 360°
Demodulation Bandwidth3 kHz

Phase Lock Loop

Auto Range SelectionYES
Measurement Range± 500 Hz
Measurement Resolution50 mHz

Preamplifier

Input Gain (Attenuator)0x to 1x (16 bit internal DAC)
Parasitic Capacitance Compensation (PCC)YES (16 bit internal DAC)
Automatic PCCYES

Probe Oscillation Loop

Operating Modesself oscillation
PLL driven
lock-in/DDS driven
Amplitude Control Modesconstant excitation
constant signal
Amplitude Setpoint16 bit internal DAC
Amplitude ControlYES, adjustable PI loop filter
Input Voltage Range±10 V(peak)
Input Voltage Gain2x to 40x
Frequency Range10 kHz to 100 kHz
Output Voltage Range±10 V(peak)

PI Loop Filter (Z-Axis)

Integration Time Constantdigitally controlled
Digitally Set ParametersYES
Error Signal Inversion CapabilityYES
Sensor Signalsfrequency
phase
excitation amplitude
signal amplitude
Command Signal16 bit internal DAC
Automatic Loop Filter SetupYes, after initialization
Loop Output0 to 14V

General

Spectrum Analysisamplitude, phase
Feedback Monitor BNCfrequency
phase
excitation amplitude
signal amplitude
Probe Signal Monitor (BNC)sinewave amplitude probe (diagnostic)
Power Supply90 to 260 VAC (50/60 Hz)
Controller Dimensions16.75" x 14" x 1.75" (1U)
(42.55cm x 35.56cm x 4.45cm)
PC ConnectionUSB
Operating System32 bit: Windows 2000/XP Pro/Vista/7
64 bit: Windows XP Pro/Vista/7
LabVIEW Software OS32 bit: Windows 2000/XP Pro/Vista/7
64bit: Windows XP Pro/Vista/7


Additional Information

MadPLL® Brochure

NANOPOSITIONING: Piezo­electric nano­positioners forge low-cost atomic force microscope		AFM Video Tutorial

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