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In Situ Device-Level TEM Characterization Based on Ultra-Flexible Multilayer MoS2 Micro-Cantilever (Adv. Mater. 28/2023)
ChaojianHou,KunWang,WenqiZhang,DongleiChen,XiaokaiWang,LuFan,ChunyangLi,JingZhao,LixinDong
Advanced Materials Pub Date : 07/13/2023 00:00:00 , DOI:10.1002/adma.202370199
Abstract
TEM Cantilever Chips
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