Thin layers of nanomaterials on stretchable substrates have the potential to enable stretchable, bendable optoelectronic devices, wearable diagnostics, and more. Recently, our group reported on a novel method for finding the neo-Hookean coefficient of thin layers of silicon nanocrystals (SiNCs) on polydimethylsiloxane (PDMS). Here we elaborate on that initial study by examining the effects of the SiNC layer thickness, PDMS neo-Hookean coefficient, and SiNC surface functionality on the neo-Hookean coefficient of the SiNC layers. We found that, while the layer thickness and PDMS neo-Hookean coefficient influence the behavior of the SiNC layers, layers of surface-functionalized SiNCs do not exhibit disparate behavior from layers of bare SiNCs.