High refractive index and high transparency HfO2 nanocomposites for next generation lithography†
Woo Jin Bae,Markos Trikeriotis,Jing Sha,Evan L. Schwartz,Robert Rodriguez,Paul Zimmerman,Emmanuel P. Giannelis,Christopher K. Ober
Journal of Materials Chemistry Pub Date : 05/26/2010 00:00:00 , DOI:10.1039/C0JM00679C
Abstract

HfO2 nanoparticles stabilized with selected ligands possess high refractive index and low absorbance under 193 nm radiation. These materials combined with an appropriate photopolymer were used as a nanocomposite photoresist. The resulting nanocomposite materials were used successfully for high resolution patterning.

Graphical abstract: High refractive index and high transparency HfO2 nanocomposites for next generation lithography